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Changes To Implement the Prioritized Examination for Requests for Continued Examination

The Leahy-Smith America Invents Act includes provisions for prioritized examination of patent applications. The United States Patent and Trademark Office (Office) implemented the Leahy-Smith America Invents Act prioritized examination provision following the prioritized examination track (Track I) of the proposed 3-Track examination process in a previous final rule. The final rule was made applicable to newly filed patent applications. In order to provide patent applicants with the flexibility to accelerate processing of their applications in which a request for continued examination has been filed, the Office is now permitting applicants to request prioritized examination for applications after the filing of a request for continued examination.

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Current entry point
www.federalregister.gov/documents/2011/12/19/2011-32434/changes-to-implement-the-prioritized-examination-for-requests-for-continued-examination (permanent link in the Federal Register, verified 2026-09-30)
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Published
2011-12-19
Document type
Rule
Source
USPTO documents published in the Federal Register (Federal Register API)(retrieved 2026-10-06)

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