Additional Period for Comments on Deferred Examination for Patent Applications
The United States Patent and Trademark Office (USPTO) conducted a roundtable to obtain public input on deferral of examination for patent applications, and invited the public to submit written comments on issues raised at the roundtable or on any issue pertaining to deferral of examination. The USPTO is providing an additional comment period so that members of the public may submit additional comments on any issue pertaining to deferral of examination, and may also submit comments in reply to the comments on deferred examination that the USPTO has already received.
- Task
- Read the news
- Patent or trademark
- both
- Legacy system
- —
- Current entry point
- www.federalregister.gov/documents/2009/06/16/E9-14154/additional-period-for-comments-on-deferred-examination-for-patent-applications (permanent link in the Federal Register, verified 2026-09-30)
- Legacy system and where it moved
- No legacy system name mention in title or summary )
- Fee
- No fee mention in title or summary )
- What you need (account or API key)
- No account or key mention in title or summary )
- Published
- 2009-06-16
- Document type
- Notice
- Source
- USPTO documents published in the Federal Register (Federal Register API)(retrieved 2026-10-06)
Everything in the same category
Read the news (all 1988) · both (all 2333)
Related entry points
- Extension of Time for Comments on Deferred Examination for Patent Applications
- Notice of Public Hearing and Request for Comments on Matters Related to the Harmonization of Substantive Patent Law
- Request for Comments and Notice of Roundtable on Work Sharing for Patent Applications
- Request for Comments and Notice of Roundtable on Deferred Examination for Patent Applications
- Changes and Examination Guidelines To Implement the First-Inventor-to-File Provisions of the Leahy-Smith America Invents Act; Reopening of the Period for Comments
- Extension of the Period for Comments on the Enhancement of Quality of Software-Related Patents
- Request for Comments on Preparation of Patent Applications
- Request for Comments and Notice of Roundtable Event on Leveraging Electronic Resources To Retrieve Information From Applicant's Other Applications and Streamline Patent Issuance
- Additional Period for Comments on Interim Examination Instructions for Evaluating Patent Subject Matter Eligibility
- Changes To Implement the Prioritized Examination Track (Track I) of the Enhanced Examination Timing Control Procedures
- Notice of Roundtables and Request for Comments on Enhancement in the Quality of Patents and on United States Patent and Trademark Office Patent Quality Metrics
- Extension of the Period for Comments on the Preparation of Patent Applications
- Changes To Practice for Continuing Applications, Requests for Continued Examination Practice, and Applications Containing Patentably Indistinct Claims
- Pilot Program for Extended Time Period To Reply to a Notice To File Missing Parts of Nonprovisional Application
- Revisions and Technical Corrections Affecting Requirements for Ex Parte and Inter Partes Reexamination
- Notice on Roundtable on International Harmonization of Substantive Patent Law