Changes To Implement the Prioritized Examination for Requests for Continued Examination
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保存されている情報
The Leahy-Smith America Invents Act includes provisions for prioritized examination of patent applications. The United States Patent and Trademark Office (Office) implemented the Leahy-Smith America Invents Act prioritized examination provision following the prioritized examination track (Track I) of the proposed 3-Track examination process in a previous final rule. The final rule was made applicable to newly filed patent applications. In order to provide patent applicants with the flexibility to accelerate processing of their applications in which a request for continued examination has been filed, the Office is now permitting applicants to request prioritized examination for applications after the filing of a request for continued examination.
- Current entry point
- www.federalregister.gov/documents/2011/12/19/2011-32434/changes-to-implement-the-prioritized-examination-for-requests-for-continued-examination (permanent link in the Federal Register, verified 2026-09-30)
- Legacy system and where it moved
- No legacy system name mention in title or summary )
- Fee
- No fee mention in title or summary )
- What you need (account or API key)
- No account or key mention in title or summary )
- Published
- 2011-12-19
- Document type
- Rule
原データ更新日：2026-10-06
保存版に記録された日付です。今回の実装・デプロイ日ではありません。